QUALITY-EVALUATED VITREOUS SILICA CRUCIBLE

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United States of America Patent

SERIAL NO

15488342

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Abstract

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A quality-evaluated vitreous silica crucible for pulling silicon single crystal is provided, wherein an inner surface of the vitreous silica crucible has regions where surface defects including brown rings are to be generated when pulling silicon single crystal. The regions are distinguished using an infrared absorption spectrum or a Raman shift of the regions, wherein a position of each region and/or a density of the regions are/is specified.

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Patent Owner(s)

Patent OwnerAddress
SUMCO CORPORATION1-2-1 SHIBAURA MINATO-KU TOKYO 105-8634

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KITAHARA, Ken Akita-shi, JP 29 92
OHARA, Masami Akita-shi, JP 11 38
SATO, Tadahiro Akita-shi, JP 38 214
SUDO, Toshiaki Akita-shi, JP 56 140

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