SYSTEM AND METHOD FOR FLIP ANGLE DETERMINATION IN MAGNETIC RESONANCE IMAGING

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United States of America Patent

SERIAL NO

15321992

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Abstract

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A system and method for calculating a flip angle schedule is provided. The technique includes selecting an initial condition, providing a function for calculating flip angles, calculating flip angles, assessing the flip angles, and repeating the calculation of the flip angles by adjusting the function until a desired flip angle schedule is obtained.

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Patent Owner(s)

Patent OwnerAddress
SHANGHAI UNITED IMAGING HEALTHCARE CO LTDNO 2258 CHENGBEI RD JIADING DISTRICT SHANGHAI 201807

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
LI, Guobin Shanghai, CN 40 171
WANG, Chaohong Shanghai, CN 13 46

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