Value addition dependent data mining techniques for assembly lines
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United States of America Patent
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Oct 27, 2020
Grant Date -
Jul 20, 2017
app pub date -
Nov 3, 2016
filing date -
Jan 20, 2016
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Abstract
Methods, systems, and apparatuses for performing target parameter analysis for an assembly line including a plurality of stations. One method includes receiving, with an electronic processor, training data associated with the assembly line. The training data including a plurality of attributes. The method also includes receiving, with the electronic processor, value addition data for each of the plurality of stations. The value addition data for each of the plurality of stations specifying a non-negative value added by each of the plurality of stations. The method also includes learning, with the electronic processor, a decision tree based on the training data and the value addition data. The method also includes performing the target parameter analysis based on the decision tree.
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