Failure prediction apparatus for electric device and failure prediction method using the same
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United States of America Patent
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Jul 14, 2020
Grant Date -
Jul 20, 2017
app pub date -
Jan 9, 2017
filing date -
Jan 20, 2016
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Abstract
Provided is a failure prediction method using a failure prediction apparatus, including: receiving time-series data about measured performance parameters from a device under test; encoding the time-series data with a plurality of symbols corresponding to a predetermined range; calculating a transition probabilities between the symbols of the encoded time-series data, and generating a transition matrix according to the transition probabilities; calculating an abnormal indicator, which is a difference between the transition matrix and a pre-stored database, and an increased value of the abnormal indicator; and comparing the increased value of the abnormal indicator and a predetermined threshold value, and if the increased value of the abnormal indicator is greater than the predetermined threshold value, predicting that failure of the device under test is to occur.
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