METHODS AND SYSTEMS FOR ROOT CAUSE ANALYSIS FOR ASSEMBLY LINES USING PATH TRACKING
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United States of America Patent
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Jul 20, 2017
app pub date -
Jan 17, 2017
filing date -
Jan 19, 2016
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Methods and systems for performing root cause analysis for an assembly line including a plurality of nodes using path tracking. One method includes receiving tracking data identifying a subset of the plurality of nodes processing a product produced by the assembly line and receiving approval data associated with the assembly line identifying whether each product produced by the assembly line fails an approval metric. The method also includes enumerating a plurality of paths through the assembly line based on the tracking data and determining a failure rate for each of the plurality of paths based on the approval data. In addition, the method includes identifying a malfunctioning path included in the plurality of paths based on the failure rate for each of the plurality of paths, identifying a malfunctioning node based on the malfunctioning path, and performing an automatic action to address the malfunctioning node.
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