APPARATUS AND METHOD FOR ANALYZING RADIOGRAPHY POSITION ERROR OR RADIOGRAPHY CONDITION ERROR OR BOTH BASED ON X-RAY RADIOGRAPH

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United States of America Patent

APP PUB NO 20170193675A1
SERIAL NO

15397774

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Abstract

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Disclosed is an apparatus and method for analyzing a radiography position error or a radiography condition error or both on basis of an x-ray radiograph. The apparatus includes an error data output unit outputting error data indicating that a radiography position or a radiography condition or both are incorrect by analyzing the X-ray radiograph; and an error data record unit recording the error data, wherein the error data output unit includes at least one of: a horizontal alignment error analysis unit analyzing a horizontal alignment error; a vertical alignment error analysis unit analyzing a vertical alignment error; a canine tooth alignment error analysis unit analyzing a canine tooth alignment error; an irradiation condition selection error analysis unit analyzing an irradiation condition selection error; a lead apron wearing error analysis unit analyzing a lead apron wearing error; and a Frankfort line alignment error analysis unit analyzing a Frankfort line alignment error.

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Patent Owner(s)

Patent OwnerAddress
VATECH CO LTD13 SAMSUNG 1-RO 2-GIL HWASEONG-SI GYEONGGI-DO 445-170
VATECH EWOO HOLDINGS CO LTD13 SAMSUNG 1-RO 2-GIL HWASEONG-SI 18449

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HAN, Tae Hee Gyeonggi-do, KR 34 155
IM, Se Yeol Gyeonggi-do, KR 5 28
SEO, Dong Wan Gyeonggi-do, KR 15 66

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