LOW LEAKAGE RESISTIVE RANDOM ACCESS MEMORY CELLS AND PROCESSES FOR FABRICATING SAME

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United States of America Patent

SERIAL NO

15374957

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Abstract

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A resistive random access memory device is formed in an integrated circuit between a first metal layer and a second metal layer and includes a first barrier layer disposed over the first metal layer, a tunneling dielectric layer disposed over the first barrier layer, a solid electrolyte layer disposed over the tunneling dielectric layer, an ion source layer disposed over the solid electrolyte layer, and a second barrier layer disposed over the ion source layer.

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Patent Owner(s)

Patent OwnerAddress
MICROSEMI SOC CORPORATION3870 NORTH FIRST STREET SAN JOSE CA 95134

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dhaoui, Fethi Mountain House, US 47 383
Hawley, Frank W Campbell, US 28 814
McCollum, John L Orem, US 77 2822

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