DEVICE AND METHOD FOR CALCULATING TRAPPING PARAMETERS BY MEASURING SHORT-CIRCUIT CURRENT DECAY UNDER REVERSE BIAS VOLTAGE
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United States of America Patent
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Mar 5, 2017
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Sep 10, 2014
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Abstract
A device for calculating trapping parameters by measuring short-circuit current decay under a reverse bias voltage, including: a vacuum chamber, an experiment table, a lower electrode, a shielding layer, an upper electrode, a direct current charging module, a switch, a short-circuit measuring system, and a computer. The experiment table, the lower electrode, the shielding layer, the test sample, and the upper electrode are disposed from the bottom up in that order inside the vacuum chamber. The upper electrode is connected to the direct current charging module via the switch. The upper electrode and the lower electrode are electrically connected via the short-circuit measuring system. The short circuit or the detrapping current measuring circuit is selectively electrically connected under the control of the selective switch. The reverse bias voltage source and the microammeter are connected in series.
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