Apparatus and Method for Monitoring Performance of Integrated Circuit

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United States of America Patent

APP PUB NO 20170170815A1
SERIAL NO

15373231

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present disclosure discloses an apparatus and method for monitoring performance of an integrated circuit. The apparatus includes a delay line, which receives a pulse signal. The delay line has a controllable, variable length and propagates the pulse signal through a set length. The apparatus also includes a comparator, which receives the propagated pulse signal from the delay line and a clock signal, the comparator being arranged to determine whether the received signal is received early or late. The apparatus also includes a feedback loop, which receives input from the comparator for dynamically increasing or decreasing the set length of the delay line in dependence of the determination by the comparator. The apparatus determines a speed of the integrated circuit based on a determination by the comparator that the signal from the delay line closely matches the clock signal.

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Patent Owner(s)

Patent OwnerAddress
STICHTING IMEC NEDERLANDHIGH TECH CAMPUS 31 EINDHOVEN 5656 AE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Stuijt, Jan Eindhoven, NL 2 2

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