Sample holder for scanning electron microscopy (SEM) and atomic force microscopy (AFM)
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United States of America Patent
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Jul 17, 2018
Grant Date -
Jun 15, 2017
app pub date -
Dec 9, 2016
filing date -
Dec 10, 2015
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Abstract
The present invention refers to a two-systems compact specimen holder (SH) easy to use which enables to analyze the same sample by employing either an atomic force microscope (AFM) or a scanning electron microscope (SEM), by preserving the setting reference of the details for both microscopies, so that it satisfies the requirements of size, conductivity, magnetization, tidiness, reference and adaptability.
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