ELECTRONIC CONTROL MODULE TESTING SYSTEM
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United States of America Patent
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May 25, 2017
app pub date -
Nov 20, 2015
filing date -
Nov 20, 2015
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Abstract
A testing system for testing an Electronic Control Module (ECM) of a machine is provided. The testing system comprises a host system and a hardware-in-loop (HIL) system. The HIL system includes a simulation model having one or more latency-sensitive test cases associated with the machine. The HIL system includes a processing unit. The processing unit is configured to simulate the one or more latency-sensitive test cases in response to a test initiation trigger signal from the host system. The testing system further includes an input/output (I/O) unit. The input/output unit is configured to communicate with the processor and an ECM under test.
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