PROBE CARD AND MULTILAYER CIRCUIT BOARD THIS PROBE CARD INCLUDES
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United States of America Patent
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app pub date -
Feb 3, 2017
filing date -
Aug 11, 2014
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Abstract
A probe card for use in electrical testing of a device under test includes a mother substrate, a multilayer circuit board mounted on one main surface of the mother substrate, an outer electrode on the mother substrate, a coupling electrode on the main surface of the multilayer circuit board opposite the mother substrate to which a probe pin for supplying power to the device under test is connected, a power line PL coupling the outer electrode and the coupling electrode together, and a blowout portion including fuse wiring, the fuse wiring inserted in the power line PL and having a smaller current capacity than the power line PL. The power line PL has an exposed portion that is exposed on the surface of the multilayer circuit board, and the blowout portion is in the exposed portion of the power line PL.
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