Systems and methods for electrical inspection of flat panel displays using cell contact probing pads
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United States of America Patent
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Mar 30, 2021
Grant Date -
May 25, 2017
app pub date -
Nov 22, 2016
filing date -
Nov 24, 2015
priority date (Note) -
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Abstract
A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.
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