SYSTEMS AND METHODS FOR MONITORING COMPONENTS
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United States of America Patent
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May 18, 2017
app pub date -
Nov 16, 2015
filing date -
Nov 16, 2015
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Abstract
Systems and methods for monitoring components are provided. A component has an exterior surface. A method includes projecting structured light onto a predetermined location on the exterior surface of the component. The structured light is emitted from a structured light emitter. The method further includes detecting the structured light after the structured light is reflected by the exterior surface. The method further includes calculating at least one characteristic of the detected structured light.
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