THREE-DIMENSIONAL MEASUREMENT SYSTEM FOR MARKED LINE FOR ADHERING SOLE TO UPPER AND THREE-DIMENSIONAL MEASUREMENT METHOD THEREFOR

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United States of America Patent

SERIAL NO

15127111

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Abstract

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A three-dimensional measurement (C) system for a marked line for adhering a sole (A) to an upper (B) and a three-dimensional measurement method therefor. A three-dimensional structure of a sole inner surface (A1) is measured automatically using a three-dimensional scanner (30), so as to form three-dimensional inner surface data (201) of the sole (A); and by conducting operation processing on the three-dimensional inner surface data (201) of the sole (A) and three-dimensional surface data (202) of the upper (B), a contour line (A2) of the sole inner surface (A1) is transferred to an upper lower surface (B1), so as to form a processing marked line of the upper (B), thereby improving the operation efficiency of adhering the sole (A) to the upper (B).

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Patent Owner(s)

Patent OwnerAddress
ORISOL ASIA LTDCHANG HWA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
MAKOVER, Jakov Maccabim, IL 13 78
MARDIX, Bar Cochva Tel Aviv, IL 11 56
SADEH, Yaacov Rechovot, IL 31 430

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