METHOD AND APPARATUS FOR IMPROVING YIELD FOR NON-VOLATILE MEMORY
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United States of America Patent
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Issued Date -
Apr 6, 2017
app pub date -
Oct 2, 2015
filing date -
Oct 2, 2015
priority date (Note) -
Abandoned
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Abstract
A method, apparatus and computer program product are provided in order to test word line failure of a non-volatile memory device. An example of the method includes performing a failure screening of the non-volatile memory device, wherein the non-volatile memory device comprises one or more word lines; identifying a point of failure located between a first word line and a second word line; and marking the first word line and the second word line as a single word line in response to identifying the point of failure between the first word line and the second word line.
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