CONDUCTIVE TEMPERATURE CONTROL

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United States of America Patent

SERIAL NO

14841369

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Abstract

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A test system includes a transporter having test sockets, where each test socket is configured to receive a device to be tested by the test system, and each test socket includes an element that is controllable to change a temperature of a device in the test socket through thermal conduction. The test system includes a test rack comprising slots. The transporter is configured for movement into, and out of, a slot of the test rack to test devices in the test sockets.

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Patent Owner(s)

Patent OwnerAddress
TERADYNE INC600 RIVERPARK DRIVE NORTH READING MA 01864

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Campbell, Philip Bedford, US 21 285
Carvalho, Valquirio N Lowell, US 5 88
Orchanian, Shant Winchester, US 3 60
Pollack, Matthew David Cambridge, US 1 16

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