MODULAR METERING SYSTEM
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United States of America Patent
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Issued Date -
Mar 2, 2017
app pub date -
Nov 20, 2016
filing date -
Jun 14, 2013
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Abstract
A metering system that may find use to generate values for measured parameters of materials. The metering system may be configured with a metrology device configured to generate a first signal in digital format to convey information about material in a conduit. The metering system may also include an accessory coupled with the metrology device, the accessory configured to use the information of the first signal to generate a second signal, the second signal conveying information that defines a measured parameter for the material. In one implementation, the accessory comprises executable instructions that configure the accessory to exchange information with the metrology device so as to verify a regulatory status for the metrology device.
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