Semiconductor integrated circuit and electronic control unit
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United States of America Patent
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May 14, 2019
Grant Date -
Mar 2, 2017
app pub date -
Jun 30, 2016
filing date -
Aug 28, 2015
priority date (Note) -
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Abstract
In order to provide a semiconductor integrated circuit capable of predicting its own lifetime (wear out failure) due to the aged deterioration and notifying a warning, it includes a processor, a temperature sensor, a non-volatile memory, and a comparator formed on the same semiconductor substrate. The comparator compares a temperature measured by the temperature sensor with a predetermined temperature threshold, and the non-volatile memory accumulatively holds the information (cumulative time) about a period having the temperature exceeding the temperature threshold. The semiconductor integrated circuit notifies the outward of a warning when the cumulative time having the temperature exceeding the temperature threshold exceeds a predetermined high temperature time threshold.
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