TESTING UNIT AND TESTING APPARATUS USING THE SAME

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United States of America Patent

APP PUB NO 20170052218A1
SERIAL NO

14990773

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Abstract

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A testing apparatus includes a substrate and a testing unit. The testing unit includes a testing pin, in which the testing pin is strip-shaped and has a connecting portion, a first end, and a second end. The first end and the second end of the testing pin are opposite to each other. The first end and the second end are connected to the substrate. The connecting portion is located between the first end and the second end, and the connecting portion protrudes from the substrate to become arc-shaped.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78
GLOBAL UNICHIP CORPORATIONNO 10 LIXING 6TH RD SCIENCE-BASED INDUSTRIAL PARK HSINCHU 30078

International Classification(s)

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  • 2016 Application Filing Year
  • G01R Class
  • 4756 Applications Filed
  • 3798 Patents Issued To-Date
  • 79.86 % Issued To-Date
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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHENG, Chih-Feng Taoyuan City, TW 35 26
LIAO, Chih-Chieh Taipei City, TW 26 12
SUN, Yu-Min New Taipei City, TW 30 24

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges400170425163241623181358501 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0100200300400500600700800900100011001200130014001500160017001800

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