METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE INCLUDING FORMING A DIELECTRIC LAYER AROUND A PATTERNED ETCH MASK

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United States of America Patent

APP PUB NO 20170047251A1
SERIAL NO

14824091

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Abstract

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A method of manufacturing a semiconductor device includes: providing a semiconductor having active regions; depositing a dielectric layer on the semiconductor; forming a patterned etch mask on the dielectric layer; depositing a further dielectric layer on the dielectric layer and the patterned etch mask; planarizing the further dielectric layer until the patterned etch mask is exposed; and forming a further patterned etch mask having an opening on the further dielectric layer so that portions of the patterned etch mask are exposed from the opening.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPNO 3 LI-HSIN ROAD 2 SCIENCE-BASED INDUSTRIAL PARK HSIN-CHU CITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Yi-Wei Taichung City, TW 221 1578
Huang, Chih-Sen Tainan City, TW 80 1037
Hung, Ching-Wen Tainan City, TW 118 1052
Lee, Yi-Hui Taipei City, TW 62 241
Li, Kun-Ju Tainan City, TW 51 75
Liu, Ying-Cheng Tainan City, TW 37 147
Lo, Wei-Cyuan Taichung City, TW 6 9
Wu, Jia-Rong Kaohsiung City, TW 64 420
Wu, Yi-Kuan Kaohsiung City, TW 13 64

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