APPARATUS AND METHODS TO DETECT SEMICONDUCTOR DEVICE DEGRADATION DUE TO RADIATION EXPOSURE
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United States of America Patent
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Issued Date -
Feb 9, 2017
app pub date -
Aug 3, 2015
filing date -
Aug 3, 2015
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Abstract
Apparatus and methods to detect degradation due to radiation exposure are described. An example method to detect circuit failure due to radiation exposure includes determining a current of a semiconductor device in an analog circuit, determining an amount of radiation to which the semiconductor device has been exposed based on the current, comparing the amount of radiation to a radiation dose threshold value, and indicating a degradation of the semiconductor device based on the comparison.
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