MEMORY DEVICE AND FABRICATING METHOD THEREOF

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United States of America Patent

APP PUB NO 20170033100A1
SERIAL NO

14814459

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Abstract

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A memory device and a method for fabricating thereof are provided. The memory device includes a substrate, a first active region, a second active region, a gate structure, and a contact structure. The first active region and the second active region are alternately disposed in the substrate. The gate structure is disposed in the substrate and between the first active region and the second active region. The contact structure is over the substrate and electrically connected to one of the first active region and the second active region. The contact structure includes a metal portion directly in contact with one of the first active region and the second active region.

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Patent Owner(s)

Patent OwnerAddress
INOTERA MEMORIES INCNO 667 FUHSING 3RD RD HWA-YA TECHNOLOGY PARK GUISHAN DIST TAOYUAN CITY 333

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
WU, Tieh-Chiang Taoyuan City, TW 78 290

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges26979357140748325312788503629173801 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +050010001500200025003000350040004500500055006000650070007500800085009000950010000

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