NON-VOLATILE MEMORY DEVICE FOR REDUCING BIT LINE RECOVERY TIME

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United States of America Patent

APP PUB NO 20170025179A1
SERIAL NO

14808745

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Abstract

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Methods and apparatuses are contemplated herein for reducing bit-line recovery time of nonvolatile memory devices. In an example embodiment, a nonvolatile memory device comprises a 3D array of non-volatile memory cells, including a plurality of blocks, each block comprising a plurality of NAND strings, each of the NAND strings coupled to a bit line and word lines, the word lines arranged orthogonally to the NAND strings and establishing the memory cells at cross-points between surfaces of the NAND strings and the word lines, and a first set of discharge transistors positioned at an edge of the 3D array, coupled to a corresponding bit line, and configured for BL discharge, and a second set of discharge transistors positioned such that a first portion of BL potential is discharged through the first set of discharge transistors and a second portion through the second set.

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MACRONIX INTERNATIONAL CO LTDNO 16 LI HSIN ROAD SCIENCE-BASED INDUSTRIAL PARK HSINCHU

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  • 2015 Application Filing Year
  • G11C Class
  • 4029 Applications Filed
  • 3679 Patents Issued To-Date
  • 91.32 % Issued To-Date
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Inventor Name Address # of filed Patents Total Citations
Ku, Shaw-Hung Hsinchu City, TW 24 247
Lee, Chih-Wei New Taipei City, TW 65 344
Suzuki, Atsuhiro Hsinchu City, TW 33 164

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges352177432312659221491211801 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +01002003004005006007008009001000110012001300140015001600170018001900

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