TIME CORRECTED TIME-DOMAIN REFLECTOMETER
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United States of America Patent
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Jul 20, 2015
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Jul 20, 2015
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Abstract
A test and measurement instrument including an input configured to receive a reflected and/or transmitted pulse signal from a device under test, a reference clock input configured to receive a reference signal, the reference signal being asynchronous from the reflected pulse signal, a phase reference module configured to acquire samples of the reference signal, a sampling module configured to acquire samples of the reflected pulse signal; and a controller configured to determine a scattering parameter of the device under test based on the acquired samples of the reference signal and the acquired samples of the reflected pulse signal.
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