ATOMIC FORCE MICROSCOPE MEASURING DEVICE
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United States of America Patent
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Jan 26, 2017
app pub date -
Feb 17, 2015
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Feb 17, 2014
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Abstract
Atomic force microscope measuring device comprising a micro-cantilever and an intensity modulated laser exciting the cantilever, wherein the measuring device comprises an optical microscope, in particular a fluorescence microscope, a confocal microscope, a fluorescence energy transfer (FRET) microscope, a DIC and/or phase contrast microscope, all of those in particular construed as an inverted microscope.
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