MEASUREMENT DEVICE FOR CORRECTING PARASITIC MOVEMENTS IN AN X-RAY TOMOGRAPH
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United States of America Patent
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Apr 7, 2015
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Apr 8, 2014
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Abstract
The invention concerns a device for measuring parasitic movements in a sample (5) to be analysed in an X-ray tomography apparatus, the device comprising: a source (1) emitting an X-ray beam (6) to a detector (3), the sample, carried by a support (13), being traversed by the beam; and a sight (17) carrying at least three balls (21) that are opaque to X-rays, the sight being attached to said support such that, on the detector, images (25) of the balls are around an image (16) of the sample, the shape and the materials of the sight being chosen such that the positions of the balls relative to the support are insensitive to temperature variations.
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