HYDROGEN GAS INSPECTION METHOD
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United States of America Patent
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app pub date -
Jun 27, 2016
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Jul 22, 2015
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Abstract
A hydrogen gas inspection method includes: converting first light having a first wavelength to second light having a second wavelength longer than the first wavelength by using a phosphor, the first light being emitted from a semiconductor light emitting device; irradiating a space to be inspected with the second light; and determining whether hydrogen gas is present in the space utilizing Raman scattered light generated by the hydrogen gas irradiated with the second light.
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