Resistive Random Access Memory And Writing Operation Method Thereof

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United States of America Patent

APP PUB NO 20170018306A1
SERIAL NO

15121101

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Abstract

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The invention provides a resistive random access memory and a writing operation method thereof, and pertains to the technical field of resistive random access memory (ReRAM). The resistive random access memory comprises a writing operation signal generation module which is at least used for generating electrical signal(s) hazing gradually reducing voltages as set operation signals; in a Set operation method of the writing operation method, electrical signal(s) hazing gradually reducing voltages are biased, as Set operation signals, onto a selected memory unit in the resistive random access memory. The Set operation method can improve storage performances of ReRAM in terms of endurance, data retention and high resistance/low resistance window, etc.

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Patent Owner(s)

Patent OwnerAddress
FUDAN UNIVERSITYSHANGHAI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lin, Yinyin Shanghai, CN 15 39
Meng, Ying Shanghai, CN 22 30

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