Method for Filling a Trench and Semiconductor Device

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United States of America Patent

APP PUB NO 20170012110A1
SERIAL NO

15205323

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Abstract

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A method includes forming a first trench in a semiconductor body between two semiconductor fins, filling the first trench with a first filling material, partially removing the first filling material by forming a second trench such that the second trench has a lower aspect ratio than the first trench, and at least partially filling the second trench with a second filling material so as to form a continuous material layer on the first filling material. A semiconductor device includes a first trench in a semiconductor body between two semiconductor fins, the first trench being filled with a first filling material, and a second trench having a lower aspect ratio than the first trench and being at least partially filled with a second filling material which forms a continuous material layer on the first filling material.

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Patent Owner(s)

Patent OwnerAddress
INFINEON TECHNOLOGIES DRESDEN GMBHDRESDEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bartels, Martin Dresden, DE 16 43
Lemke, Marko Dresden, DE 36 149
Tegen, Stefan Dresden, DE 71 517
Weis, Rolf Dresden, DE 146 1480

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