PHOTODETECTORS BASED ON INTERBAND TRANSITION IN QUANTUM WELLS

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United States of America Patent

SERIAL NO

15058836

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Abstract

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The present application relates to a photodetector based on interband transition in quantum wells. The photodetector may include a first semiconductor layer having a first conduction type; a second semiconductor layer having a second conduction type different from the first conduction type; and a photon absorption layer arranged between the first semiconductor layer and the second semiconductor layer, the photon absorption layer including at least one quantum well layer and barrier layers arranged on both sides of each quantum well layer. The present application utilizes the modulating effect of a semiconductor PN junction on a photoelectric conversion process associated with quantum wells to significantly increase a current output of the photodetector based on the quantum well material.

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Patent OwnerAddress
INSTITUTE OF PHYSICS CHINESE ACADEMY OF SCIENCES100190 NO 8 SOUTH THIRD STREET HAIDIAN DISTRICT BEIJING ZHONGGUANCUN BEIJING CITY BEIJING CITY 100190

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Hong Beijing, CN 429 4330
Jia, Haiqiang Beijing, CN 2 14
Jiang, Yang Beijing, CN 28 51
Ma, Ziguang Beijing, CN 1 6
Wang, Lu Beijing, CN 460 6920
Wang, Wenxin Beijing, CN 20 61

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