SIMILARITY DETERMINATION APPARATUS, SIMILARITY DETERMINATION METHOD AND SIMILARITY DETERMINATION PROGRAM

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United States of America Patent

APP PUB NO 20160378445A1
SERIAL NO

14958074

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Abstract

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An objective is to extract, as similar functions, not only a pair of functions having the same syntax, but also a pair of functions having different syntaxes but performing similar processes. A similarity determination apparatus includes: a dependency analyzing section to get a list of dependee elements as a dependency list, from a source code including a plurality of functions, each function depending on one of the dependee elements; a similarity calculating section to calculate, based on the dependency list, similarity between the dependee elements on which two of the plurality of functions depend, as dependee similarity, and calculate, based on the calculated dependee similarity. similarity between the two functions, as depender similarity; and a similarity threshold determining section to determine that the two functions are similar to each other when the depender similarity is equal or exceeds a first threshold.

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Patent Owner(s)

Patent OwnerAddress
MITSUBISHI ELECTRIC CORPORATION7-3 MARUNOUCHI 2-CHOME CHIYODA-KU TOKYO 100-8310

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
FUJII, Natsuko Tokyo, JP 8 24
HIKAWA, Yuki Tokyo, JP 10 27
KASHIWAGI, Ryo Tokyo, JP 15 40
NAKAMURA, Katsuhiko Tokyo, JP 18 96
YAMADA, Takamitsu Tokyo, JP 17 170

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