HIGH-PURITY 1-FLUOROBUTANE AND PLASMA ETCHING METHOD

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United States of America Patent

APP PUB NO 20160372335A1
SERIAL NO

14898778

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention provides: 1-fluorobutane having a purity of 99.9% by volume or more and a total butene content of 1,000 ppm by volume or less; use of the 1-fluorobutane as a dry etching gas; and a plasma etching method using the 1-fluorobutane as an etching gas. According to the present invention, high-purity 1-fluorobutane which is suitable as a plasma reaction gas for semiconductors, the use of the high-purity 1-fluorobutane as a dry etching gas, and a plasma etching method using the high-purity 1-fluorobutane as an etching gas are provided.

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Patent Owner(s)

Patent OwnerAddress
ZEON CORPORATION6-2 MARUNOUCHI 1-CHOME CHIYODA-KU TOKYO 1008246

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sugimoto, Tatsuya Tokyo, JP 72 204

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