MODELLING METHOD AND SYSTEM

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United States of America Patent

APP PUB NO 20160357878A1
SERIAL NO

14731985

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method includes defining a group of control points representing the freeform geometry, defining an initial baseline between a start point and an end point of the freeform geometry and deriving an initial set of parameters for each control point to represent an initial location of the control point relative to the initial baseline. The method includes choosing a new start point and a new end point for a modified freeform geometry, defining a new baseline between the new start point and the new endpoint; applying a modification to the freeform geometry, deriving a recalculated set of parameters for each of the control points to provide a representation of a new location of the control point, relative to the new baseline, for the applied modification and rendering the modified freeform geometry using the recalculated set of parameters.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS PRODUCT LIFECYCLE MANAGEMENT SOFTWARE INC5800 GRANITE PARKWAY SUITE 600 PLANO TX 75024-6612

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
King, Douglas Joseph Peterborough, GB 25 37
Mattson, Howard Charles Duncan Cambridge, GB 25 35
Zhu, Yanong Cambridge, GB 16 169

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