MICROORGANISM MEASURING SYSTEM AND MICROORGANISM MEASURING METHOD

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United States of America Patent

APP PUB NO 20160348146A1
SERIAL NO

15116662

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A microorganism measuring system set control reference values with higher accuracy than ever. Based on results of repeated CFU countings and results of repeated ATP measurements, a microorganism measuring system obtains a probability density function of ATP measured values in a normal condition; determines an alert reference value at which a desired probability of false positives is equal to or less than a probability, and an action reference value at which a desired probability of false negatives is equal to or less than a probability; and thereby controls the ATP measured values. For this reason, the microorganism measuring system can set the control reference values with higher accuracy than ever, without being influenced by an error in the conversion of ATP contents into CFU counts. Accordingly, the microorganism measuring system can achieve the microbiological control with desired control accuracy

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Patent Owner(s)

Patent OwnerAddress
HITACHI PLANT SERVICES CO LTDTOKYO 170-6034

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
MIYASHITA, Noe Tokyo, JP 22 127
TANAKA, Makoto Tokyo, JP 342 5714

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