YIELD MONITOR CALIBRATION METHOD AND SYSTEM
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United States of America Patent
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Dec 1, 2016
app pub date -
Mar 25, 2016
filing date -
Sep 27, 2013
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Abstract
The present disclosure relates to a methods and systems for calibrating a yield monitor. The method includes delivering a first harvested crop load from a first harvester to a cart, the first harvester including a harvester yield monitor and the cart including a cart sensor. A harvested crop characteristic of the first harvested crop load is measured with the yield monitor. The method includes calibrating the harvester yield monitor based on the harvested crop characteristic and a true crop characteristic and repeating the calibrating with on-going delivering of at least one subsequent harvested crop load from the first harvester to the cart and measuring of a subsequent harvested crop characteristic.
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