TESTING OF COMPONENTS FOR CONTAMINATIONS
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United States of America Patent
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Issued Date -
Nov 17, 2016
app pub date -
May 11, 2016
filing date -
May 11, 2015
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Abstract
A method for testing a component for contamination. The method comprises a heating of a specimen surface of the component under a measuring bell defining a measurement volume, an at least two-time measuring of a contamination of the measurement volume with at least one contaminant, and a purging of the measurement volume with gas. An apparatus for testing a component for contamination is also disclosed. The apparatus comprises a measuring bell configured to form a measurement volume about the component or contacting the component. A heating element is configured to heat at least one specimen surface of the component. A purging unit is configured to purge the measurement volume with gas. A sensor system is configured to measure a contamination of the measurement volume with at least one contaminant.
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