INTERFEROMETRY-BSED IMAGING AND INVERSION

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United States of America Patent

APP PUB NO 20160327668A1
SERIAL NO

15111724

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Methods and apparatuses for processing measurements to create an interferometry-based metric to measure inaccuracy of a model. The metric is used as a cost function for nonlinear inversions or simplified linear inversions or imaging.

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Patent Owner(s)

Patent OwnerAddress
WESTERNGECO L L C10001 RICHMOND AVENUE HOUSTON TX 77042

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Pires, De Vasconcelos Ivan Cambridge, GB 5 21

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