Spectrometer with random beam profiles
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United States of America Patent
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Jul 17, 2018
Grant Date -
Nov 10, 2016
app pub date -
May 4, 2015
filing date -
May 4, 2015
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Abstract
A spectrometer includes a light source configured to emit a beam along a beam path through a sample volume comprising an analyte. Also included is at least one detector positioned to detect at least a portion of the beam emitted by the light source, and at least one reflector positioned along the beam path intermediate the light source and the at least one detector having a surface roughness greater than a predefined level such as 20 Å RMS.
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