High Sensitivity Tunable Radio Frequency Sensors
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United States of America Patent
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Apr 29, 2016
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Apr 30, 2015
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Abstract
Systems and methods of determining characteristics of a material under test using highly sensitive, tunable RF sensors are disclosed. For instance, an RF sensor can include one or more interferometers having a reference branch and a test branch. The test branch includes a microstrip resonator and a coupled line filter. The RF sensor can further include a first port associated with each of the one or more interferometers configured to separate signals between a first transmission line and a second transmission line operable to provide a test signal to the resonator. and filter. The RF sensor can further include a signal analyzer coupled to the first port of the one or more interferometers operable to measure one or more scattering parameters. Wherein at least one of the one or more scattering parameters is indicative of one or more characteristics of a dielectric material disposed on the coupled line filter.
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