ARRAY NEAR-FIELD HIGH OPTICAL SCATTERING MATERIAL DETECTION METHOD

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United States of America Patent

SERIAL NO

14697633

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Abstract

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An array near-field high optical scattering material detection method is disclosed, which comprises steps of irradiating an input light onto a high scattering material to generate a diffuse reflection, a diffusion, and a transmission within the high scattering material; reading out an optical energy over different positions on the high scattering material, respectively; forming a two dimensional light intensity distribution data image according to the optical energy over different positions on the high scattering material, respectively; and analyzing an internal composition variation of the high scattering material according to the two dimensional light intensity distribution data image to obtain the internal composition data of the high scattering material. By using the above technical means, the internal composition of the high optical scattering material may be known by detecting the same, and may be successfully applied onto a detection use on the green technology involving the biomedical engineering, chemical engineering, and environmental engineering.

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Patent OwnerAddress
NATIONAL APPLIED RESEARCH LABORATORIES3F NO 106 HO-PING E RD SEC 2 TAIPEI CITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHOU, Shih Jie Taipei, TW 1 1
HUANG, Chi Hung Taipei, TW 4 3
HUANG, Hung Ji Taipei, TW 6 12
TSENG, Sheng Hao Taipei, TW 3 14
TZENG, Shih Yu Taipei, TW 1 1
WENG, Rui Cian Taipei, TW 1 1

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