Importance

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Abstract

The present invention provides a semiconductor device which is easily tested. A semiconductor device includes an input signal to which an operation clock signal is supplied, a process unit having a plurality of F/F circuits synchronized with the operation clock signal, output terminals to which an output signal of the process unit is transmitted, output-stage F/F circuits coupled between the process unit and the output terminals, an input terminal to which a test signal is supplied, an input terminal to which a test clock signal is supplied, an output terminal to which the test clock signal is transmitted via a signal line, and first selection circuits selecting a clock signal with which the output-stage F/F circuit is synchronized and an input of the output-stage F/F circuit.

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First Claim