STACKED SEMICONDUCTOR STRUCTURE

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United States of America Patent

APP PUB NO 20160268230A1
SERIAL NO

14656704

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Abstract

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A stacked semiconductor structure includes a first wafer, a second wafer, a first insulting layer, and a second insulating layer. The first wafer includes a first front surface, a first back surface, and a first interconnection structure. The first interconnection structure includes at least a first top metal layer exposed on the first front surface of the first wafer. The second wafer includes a second front surface, a second back surface, and a second interconnection structure. The second interconnection structure includes at least a second top metal layer exposed on the second front surface of the second wafer. The first insulating layer is formed on the first front surface of the first wafer, and the second insulating layer is formed on the second front surface of the second wafer. The first insulating layer and the second insulating layer contact each other.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPNO 3 LI-HSIN ROAD 2 SCIENCE-BASED INDUSTRIAL PARK HSIN-CHU CITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hsu, Chien-En Hsinchu County, TW 10 221
Lin, Sin-Shien Taipei City, TW 3 24
Wang, Fei Singapore, SG 1116 10607

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