Spatial phase-shift shearography system for non-destructive testing and strain measurement

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United States of America Patent

PATENT NO 10330463
APP PUB NO 20160265900A1
SERIAL NO

15032577

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Abstract

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Embodiments of a shearography system may include light sources configured to produce beams of light to illuminate a test area. Each of the beams of light may include a different wavelength. A camera may be configured to obtain intensity information corresponding to reflections of the lights off of the test area. An optical shearing device may be disposed in an optical path between the light sources and the camera and the optical shearing device may be configured to provide a shearing angle.

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Patent Owner(s)

Patent OwnerAddress
OAKLAND UNIVERSITY203 WILSON HALL ROCHESTER MI 48309-4401

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Xu Auburn Hills, US 406 3483
Xie, Xin Auburn Hills, US 72 155
Xu, Nan Auburn Hills, US 50 551
Yang, Lianxiang Rochester Hills, US 5 33

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