Photoresist with Floating-OOB-Absorption Additive

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United States of America Patent

SERIAL NO

14632603

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Abstract

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Methods and materials for making a semiconductor device are described. The method includes forming an out-of-bond-wavelength (OOB)-reduction photoresist over a substrate, forming a floating region adjacent to a top surface of the OOB-reduction photoresist. The floating region has a higher absorbance of the OOB wavelength than a bulk region of the OOB-reduction photoresist that is below the floating region. The method also includes exposing the OOB-reduction photoresist to a radiation beam, wherein an OOB radiation portion of the radiation beam is absorbed in the floating region.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Ching-Yu Yilang County, TW 578 7902
Su, Yu-Chung Hsinchu City, TW 32 90

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