INFRARED SENSOR MANUFACTURED BY METHOD SUITABLE FOR MASS PRODUCTION

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United States of America Patent

SERIAL NO

15141239

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Abstract

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An infrared sensor manufacturing method according to this invention includes a step of forming a bridge structure of an insulating material on an Si substrate, a step of forming a vanadium oxide thin film on the bridge structure by a dry film forming method, a step of irradiating laser light onto the vanadium oxide thin film to thereby change material properties thereof, a step of forming the vanadium oxide thin film with the changed material properties into a bolometer resistor having a predetermined pattern, and a step of forming a protective layer of an insulating material so as to cover the bolometer resistor having the predetermined pattern and the bridge structure.

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Patent Owner(s)

Patent OwnerAddress
NEC CORPORATION7-1 SHIBA 5-CHOME MINATO-KU TOKYO 108-8001
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGYTOKYO TOKYO METROPOLIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KUMAGAI, Toshiya Ibaraki, JP 20 117
KURASHINA, Seiji Tokyo, JP 15 119
MIZUTA, Susumu Ibaraki, JP 11 61
SASAKI, Tokuhito Tokyo, JP 19 109
TSUCHIYA, Tetsuo Ibaraki, JP 31 206

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