FILM FORMING DEVICE AND FILM FORMING METHOD

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20160237566A1
SERIAL NO

15025807

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

When a film is formed atomic layer by atomic layer with a use of a raw material gas and a reaction gas, a raw material gas is supplied into a film-forming space in which a substrate is placed to adsorb a component of the raw material gas onto the substrate. Then, a reaction gas is supplied into the film-forming space. Plasma is produced in the film-forming space using the reaction gas supplied so that part of a component of the raw material gas adsorbed on the substrate reacts with the reaction gas. At this moment, a duration of production of the plasma is set within a range of 0.5 millisecond to 100 milliseconds according to a degree of at least one property of a film to be formed, and a density of power input to the plasma source is in a range of 0.05 W/cm2 to 10 W/cm2.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
MITSUI ENGINEERING & SHIPBUILDING CO LTDCHUO-KU TOKYO 104-8439

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HATTORI, Nozomu Tamano-shi, Okayama, JP 9 335
MIYATAKE, Naomasa Tamano-shi, Okayama, JP 8 61
MORI, Yasunari Tamano-shi, Okayama, JP 11 70
NAKASHIMA, Yoshiharu Tamano-shi, Okayama, JP 14 123

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation