METHODS FOR CHARACTERIZING A POLYCRYSTALLINE DIAMOND ELEMENT BY POROSIMETRY
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United States of America Patent
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Issued Date -
Aug 11, 2016
app pub date -
Jul 11, 2014
filing date -
Jul 15, 2013
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Abstract
Embodiments disclosed herein relate to methods for measuring at least one pore characteristic of a polycrystalline diamond (“PCD”) element via porosimetry and, for example, using the measurement to adjust one or more process parameters for fabricating a PCD element and/or for quality control on such a PCD element. In an embodiment, a method for characterizing a PCD element is disclosed. The method includes providing a PCD element that includes a plurality of bonded diamond grains defining a plurality of pores therebetween. The method further includes conducting porosimetry on the PCD element to measure at least one pore characteristic of the plurality of pores of the PCD element. In an embodiment, the method additionally includes adjusting the one or more process parameters for fabricating the PCD element at least partially based on the measured at least one pore characteristic.
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