METHOD OF FORMING FINE PATTERN, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS AND RECORDING MEDIUM

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United States of America Patent

APP PUB NO 20160218012A1
SERIAL NO

15026414

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Abstract

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A fine pattern-forming method includes: a core pattern-forming step of forming a core pattern of a predetermined line width at a substrate surface side; a sidewall-forming step of forming a sidewall on the core pattern formed in the core pattern-forming step; and a core pattern removing step of removing the core pattern in a state where the sidewall is left, by using an etching gas after the sidewall-forming step, and is configured such that, in the core pattern removing step, a film deposited at a substrate back side in the core pattern-forming step is removed in parallel to the removal of the core pattern.

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Patent Owner(s)

Patent OwnerAddress
HITACHI KOKUSAI ELECTRIC INC15-12 NISHI-SHIMBASHI 2-CHOME MINATO-KU TOKYO 105-8039

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ASHIHARA, Hiroshi Toyama-shi, JP 76 2625
HIROSE, Yoshiro Toyama-shi, JP 166 5866
KAMEDA, Kenji Toyama-shi, JP 46 769
KANAYAMA, Kenji Toyama-shi, JP 22 760
KIKUCHI, Toshiyuki Toyama-shi, JP 82 514
SHIMAMOTO, Satoshi Toyama-shi, JP 53 2155
WADA, Yuichi Toyama-shi, JP 76 1105
YUGAMI, Jiro Toyama-shi, JP 41 420

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