TRENCH LATERAL DIFFUSION METAL OXIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

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United States of America Patent

APP PUB NO 20160211348A1
SERIAL NO

14601242

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Abstract

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A trench lateral diffusion metal oxide semiconductor (LDMOS) device, disposed on a substrate, comprising: a transistor and an LDMOS transistor. The transistor has a gate. The LDMOS transistor has a trench gate, wherein the trench gate protrudes from a surface of the substrate. Electrical connection of the trench gate and a doping region due to a metal silicide may be prevented by protruding the trench gate from the surface of the substrate. And furthermore a step height difference between a gate and the trench gate may be decreased, and openings respectively exposing a top portion of the trench gate and a top portion of the gate may be formed without changing the manufacturing conditions.

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Patent Owner(s)

Patent OwnerAddress
MAXCHIP ELECTRONICS CORPNO 18 LISING 1ST RD EAST DISTRICT HSINCHU CITY 300

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yoshida, Kosuke Hsinchu City, TW 42 104

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